Computer identification of ground pattern from aerial photographs.

Two statistical models are comapared in the classification of crops recorded on color aerial photographs. A theory of error ellipses is applied to the pattern recognition problem. An elliptical boundary condition classification model (EBC), useful for recognition of candidate patterns, evolves out of error ellipse theory. The EBC model is compared with the minimum distance to the mean (MDM) classification model in terms of pattern recognition ability. The pattern recognition results of both models are interpreted graphically using scatter diagrams to represent measurement space. Measurement space, for this report, is determined by optical density measurements collected from Kodak Ektachrome Infrared Aero Film 8443 (EIR). The EBC model is shown to be a significant improvement over the MDM model.