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Optical monitoring systemInstrument can measure optical transmission, reflectance, and scattering. This information can be used to identify changes in optical properties or deviations from required optical standards. Device consists of monochromatic source, photo detector, transfer mirror, and hemiellipsoid. System might be used to measure optical properties of thin film.
Document ID
19730000050
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nev, J. T. (Gen. Dynamics Corp.)
Wrench, E. H. (Gen. Dynamics Corp.)
Fox, M. G. (Gen. Dynamics Corp.)
Lave, H. (Gen. Dynamics Corp.)
Date Acquired
August 7, 2013
Publication Date
February 1, 1973
Subject Category
Physical Sciences
Report/Patent Number
MFS-21692
Report Number: MFS-21692
Accession Number
73B10050
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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