NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
An improved method for obtaining a normalized junction temperature for semiconductors: A conceptFailure rate for given semiconductor device is simply determined by reading value of normalized junction temperature from printout for any given combination of ambient temperature, stress ratio, and maximum rated junction temperature, and obtaining corresponding failure rate from graph.
Document ID
19730000196
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Trivedi, S. N. (Martin Marietta Corp.)
Date Acquired
August 7, 2013
Publication Date
June 1, 1973
Subject Category
Electronic Components And Circuits
Report/Patent Number
MSC-14136
Report Number: MSC-14136
Accession Number
73B10196
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available