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Accelerated life testing of spacecraft subsystemsThe rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.
Document ID
19730003165
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Wiksten, D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Swanson, J. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 2, 2013
Publication Date
November 1, 1972
Subject Category
Space Vehicles
Report/Patent Number
JPL-TM-33-575
NASA-CR-129096
Report Number: JPL-TM-33-575
Report Number: NASA-CR-129096
Accession Number
73N11892
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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