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Development of techniques for advanced optical contamination measurement with internal reflection spectroscopy, phase 2, volume 2Attenuated total reflectance spectra of individual contaminants in space simulation chambers are presented as well as spectra of mixtures and figures exhibiting the effects of film thickness on reflectance spectra. Detailed calibration spectra were made for three selected concentrations (film thickness) for two contaminants and for one concentration for all contaminants.
Document ID
19730007759
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Hayes, J. D. (Teledyne Brown Engineering Huntsville, AL, United States)
Date Acquired
September 2, 2013
Publication Date
December 1, 1972
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-128716
SE-NASA-1674-VOL-2
Report Number: NASA-CR-128716
Report Number: SE-NASA-1674-VOL-2
Accession Number
73N16486
Funding Number(s)
CONTRACT_GRANT: NAS9-12571
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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