NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Moire patterns and two-dimensional aliasing in line scanner data acquisition systemsThe basic mechanism underlying the generation of Moire patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. Systems design requirements for avoiding Moire pattern generation and two-dimensional aliasing are discussed.
Document ID
19730009715
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Mcgillem, C. D.
(Purdue Univ. West Lafayette, IN, United States)
Riemer, T. E.
(Purdue Univ. West Lafayette, IN, United States)
Date Acquired
September 2, 2013
Publication Date
January 1, 1973
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-130829
LARS-111772
Report Number: NASA-CR-130829
Report Number: LARS-111772
Accession Number
73N18442
Funding Number(s)
CONTRACT_GRANT: NGL-15-005-112
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available