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Neutral beam dose and sputtering characteristics in an ion implantation systemA technique and instrument design for calorimetric detection of the neutral atom content of a 60 keV argon ion beam. A beam sampling method is used to measure local heat flux to a small platinum wire at steady state; integration of power density profiles leads to a determination of equivalent neutral beam current. The fast neutral production occurs as a result of charge transfer processes in the region of the beam system between analyzing magnet and beam stop where the pressure remains less than .00001 torr. A description of the neutral beam detector is given in section along with a presentation of results. An elementary analysis of sputter material transport from target to substrate was performed; the analysis relates to semiconductor sputtering.
Document ID
19730016027
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Roberts, A. S., Jr.
(Old Dominion Univ. Norfolk, VA, United States)
Ash, R. L.
(Old Dominion Univ. Norfolk, VA, United States)
Berger, M. H.
(Old Dominion Univ. Norfolk, VA, United States)
Date Acquired
September 2, 2013
Publication Date
February 1, 1973
Subject Category
Physics, Solid-State
Report/Patent Number
TR-73-T1
NASA-CR-132254
Accession Number
73N24754
Funding Number(s)
CONTRACT_GRANT: NAS1-9434
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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