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Trace organic impurities in gaseous heliumA program to determine trace organic impurities present in helium has been initiated. The impurities were concentrated in a cryogenic trap to permit detection and identification by a gas chromatographic-mass spectrometric technique. Gaseous helium (GHe) exhibited 63 GC flame ionization response peaks. Relative GC peak heights and identifications of 25 major impurities by their mass spectra are given. As an aid to further investigation, identities are proposed for 16 other components, and their mass spectra are given.
Document ID
19730019251
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Technical Note (TN)
Authors
Schehl, T. A. (NASA John F. Kennedy Space Center Cocoa Beach, FL, United States)
Date Acquired
September 2, 2013
Publication Date
August 1, 1973
Subject Category
Chemistry
Report/Patent Number
NASA-TN-D-6520
Report Number: NASA-TN-D-6520
Accession Number
73N27983
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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