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Method and apparatus for measuring electromagnetic radiationAn apparatus and method are described in which the capacitance of a semiconductor junction subjected to an electromagnetic radiation field is utilized to indicate the intensity or strength of the radiation.
Document ID
19730019756
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Been, J. F. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
July 10, 1973
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-LEW-11159-1
Patent Application Number: US-PATENT-APPL-SN-104346
Patent Number: US-PATENT-3,745,357
Accession Number
73N28488
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LEW-11159-1|US-PATENT-3,745,357
Patent Application
US-PATENT-APPL-SN-104346

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