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Dual purpose optical instrument capable of simultaneously acting as spectrometer and diffractometerA dual purpose optical instrument is described capable of simultaneously acting as a spectrometer and diffractometer to respectively perform elemental and structural analysis of an unknown sample. The diffractometer portion of the instrument employs a modified form of Seeman-Bohlin focusing which involves providing a line source of X-rays, a sample, and a detector, all on the same focal circle. The spectrometer portion of the instrument employs a fixedly mounted X-ray energy detector mounted outside of the plane of the focal circle.
Document ID
19730019759
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Dasgupta, K.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Schnopper, H. W.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Metzger, A. E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 2, 2013
Publication Date
April 22, 1969
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-524746
Patent Number: US-PATENT-3,440,419
Patent Number: NASA-CASE-XNP-05231
Accession Number
73N28491
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-3,440,419|NASA-CASE-XNP-05231
Patent Application
US-PATENT-APPL-SN-524746
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