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RF-source resistance metersSeveral embodiments of RF source resistance measuring devices are disclosed. Common to all embodiments in the feature of the inclusion of at least one variable resistor, and a peak readout meter. In one embodiment, two ganged unloaded potentiometers are employed while another embodiment comprises an automaticnulling RF power bridge circuit with a variable rather than a fixed bridge reference resistance. A third embodiment comprises a calorimeter with a varible rather than a fixed resistor, while in another embodiment attenuator pads with variable resistors are employed.
Document ID
19730021656
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Oakley, E. C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 2, 2013
Publication Date
July 31, 1973
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-116790
Patent Number: NASA-CASE-NPO-11291-1
Patent Number: US-PATENT-3,750,016
Accession Number
73N30388
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-11291-1|US-PATENT-3,750,016
Patent Application
US-PATENT-APPL-SN-116790
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