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Some new techniques for processing remotely obtained images by self-generated spectral masks.An extension of a new technique that makes possible parallel, simultaneous processing of remotely obtained images is presented. The technique holds out promise for automatic onboard classification of data. The central feature involves the generation of binary masks, directly from the image, based on object reflectance data, that group objects into equivalence classes. These masks, called equivalence class masks, can be used in various logical combinations to isolate classes of objects with a priori known reflectance or radiance signatures. Experimental verification of the technique is furnished for simple scenes. A computational scheme, based on a sequence of integrated irradiance measurements on the image, that makes it possible to identify objects within an equivalence class is suggested.
Document ID
19730026417
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Stark, H.
Barker, R. C.
Lee, D.
(Yale University New Haven, Conn., United States)
Date Acquired
August 7, 2013
Publication Date
November 1, 1972
Publication Information
Publication: Applied Optics
Volume: 11
Subject Category
Physics, General
Accession Number
73A11219
Funding Number(s)
CONTRACT_GRANT: NGL-07-004-005
Distribution Limits
Public
Copyright
Other

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