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In situ transfer standard for ultrahigh vacuum gage calibrationA compact insitu calibration assembly, for ultrahigh vacuum gauges is described. The system depends on the repeatable generation of a specific gas pressure by the dissociation of a solid solution chemical compound when subjected to a given temperature. A precise temperature measurement is related to the pressure generated within the vacuum by the properties of the solid solution compound. this accurately establishes the gas pressure which in turn is used to calibrate a vacuum gauge. Also included is a metering orifice used in the calibration system and which is made movable to facilitate the degassing bakeout required in ultrahigh vacuum devices.
Document ID
19740006979
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Outlaw, R. A.
(NASA Langley Research Center Hampton, VA, United States)
Stell, R. E.
(NASA Langley Research Center Hampton, VA, United States)
Hoyt, R. F.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
December 25, 1973
Subject Category
General
Report/Patent Number
Patent Number: NASA-CASE-LAR-10862-1
Patent Number: US-PATENT-3,780,563
Patent Application Number: US-PATENT-APPL-SN-271951
Accession Number
74N15092
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-10862-1|US-PATENT-3,780,563
Patent Application
US-PATENT-APPL-SN-271951
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