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Dual measurement ablation sensorA dual measurement ablation sensor for measuring both char-interface and surface recession at a point in an ablating material is described. The sensor permits measurement of the thickness of the char layer. Char-interface recession is indicated by a drop in the resistance to a current passed through the ablation material. Surface recession is indicated by the closing of an electrical circuit when melting causes the release of a spring switch.
Document ID
19740007539
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Gurtler, C. A.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1974
Subject Category
General
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-170680
Patent Number: US-PATENT-3,782,181
Patent Number: NASA-CASE-LAR-10105-1
Accession Number
74N15652
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-3,782,181|NASA-CASE-LAR-10105-1
Patent Application
US-PATENT-APPL-SN-170680
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