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Moire patterns and two-dimensional aliasing in line scanner data acquisition systemsThe basic mechanism underlying the generation of Moire patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. System design requirements for avoiding Moire pattern generation and two-dimensional aliasing are discussed.
Document ID
19740034736
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Mcgillem, C. D.
Riemer, T. E.
(Purdue University West Lafayette, Ind., United States)
Date Acquired
August 7, 2013
Publication Date
January 1, 1974
Publication Information
Publication: IEEE Transactions on Geoscience Electronics
Volume: GE-12
Subject Category
Instrumentation And Photography
Accession Number
74A17486
Funding Number(s)
CONTRACT_GRANT: NGL-15-005-112
Distribution Limits
Public
Copyright
Other

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