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High-temperature capacitive strain measurement systemCapacitive strain gage and signal conditioning system measures stress-induced strain and cancels thermal expansion strain at temperatures to 1,500 F (815 C). Gage does not significantly restrain or reinforce specimen.
Document ID
19750000069
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Wilson, E. J. (Boeing Co.)
Egger, R. L.
Date Acquired
August 8, 2013
Publication Date
May 1, 1975
Subject Category
Electronic Components And Circuits
Report/Patent Number
FRC-10053
Report Number: FRC-10053
Accession Number
75B10069
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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