NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Bubble-domain circuit wafer evaluation coil setCoil structures have been designed to permit nondestructive testing of bubble wafers. Wafers can be electrically or optically inspected and operated from quasi-static frequency to maximum device operating frequency.
Document ID
19750000197
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Chen, T. T. (Rockwell Intern. Corp.)
Williams, J. L. (Rockwell Intern. Corp.)
Date Acquired
August 8, 2013
Publication Date
September 1, 1975
Subject Category
Electronic Components And Circuits
Report/Patent Number
Report Number: LAR-11728
LAR-11728
Accession Number
75B10197
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available