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Lunar elemental analysis obtained from the Apollo gamma-ray and X-ray remote sensing experimentGamma ray and X-ray spectrometers carried in the service module of the Apollo 15 and 16 spacecraft were employed for compositional mapping of the lunar surface. The measurements involved the observation of the intensity and characteristics energy distribution of gamma rays and X-rays emitted from the lunar surface. A large scale compositional map of over 10 percent of the lunar surface was obtained from an analysis of the observed spectra. The objective of the X-ray experiment was to measure the K spectral lines from Mg, Al, and Si. Spectra were obtained and the data were reduced to Al/Si and Mg/Si intensity ratios and ultimately to chemical ratios. The objective of the gamma-ray experiment was to measure the natural and cosmic ray induced activity emission spectrum. At this time, the elemental abundances for Th, U, K, Fe, Ti, Si, and O have been determined over a number of major lunar regions.
Document ID
19750006619
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Trombka, J. I.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Arnold, J. R.
(Calif. Univ. La Jolla, United States)
Adler, I.
(Md. Univ. College Park, United States)
Metzger, A. E.
(JPL)
Reedy, R. C.
(Los Alamos Sci. Lab.)
Date Acquired
September 3, 2013
Publication Date
January 1, 1974
Subject Category
Lunar And Planetary Exploration
Report/Patent Number
NASA-TM-X-72195
REPT-224
Report Number: NASA-TM-X-72195
Report Number: REPT-224
Meeting Information
Meeting: Sov.-Am. Conf. on the Cosmochem. of the Moon and Planets
Location: Moscow
Country: Soviet Union
Start Date: June 4, 1974
End Date: June 8, 1974
Accession Number
75N14691
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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