Analytical study of spacecraft deposition contamination by internal reflection spectroscopy

The in-situ vacuum chamber designed around the IRE was tested under vacuum. The contamination analyzer system was tested using two liquid contaminant materials. The analysis of the contaminants on the SL-4 rendezvous window shows that the material has methyl silicone, hydroxyl, and carbonyl radicals. The analysis of the outgassing material from Shuttle TPS shows silicone as the primary product.