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Electrostatic measurement systemA system for and method of contact-electrifying a dielectric to determine its electrostatic properties is described. The dielectric is placed in contact with a contact plate means, and connected to a voltage source means to charge the contact plate and to contact-electrify the dielectric. The contact plate means is disconnected from the voltage source and a charge sensor means monitors the rate of decay of the charge on the dielectric. If a conductive path from the contact plate to ground is desired, a lead may be connected between the conductor and ground. Automatic timing and charge monitoring are preferred for maximum accuracy, especially where dielectrics treated with antistatic agents are tested.
Document ID
19750010405
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Johnston, J. E.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
February 11, 1975
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Number: NASA-CASE-MFS-22129-1
Patent Application Number: US-PATENT-APPL-SN-370255
Patent Number: US-PATENT-3,866,114
Accession Number
75N18477
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-MFS-22129-1|US-PATENT-3,866,114
Patent Application
US-PATENT-APPL-SN-370255
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