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Techniques of Final Preseal Visual InspectionA dissertation is given on the final preseal visual inspection of microcircuit devices to detect manufacturing defects and reduce failure rates in service. The processes employed in fabricating monolithic integrated circuits and hybrid microcircuits, various failure mechanisms resulting from deficiencies in those processes, and the rudiments of performing final inspection are outlined.
Document ID
19750017133
Acquisition Source
Legacy CDMS
Document Type
Special Publication (SP)
Authors
Anstead, R. J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1975
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NASA-SP-6509
Report Number: NASA-SP-6509
Accession Number
75N25205
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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