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The effect of sunshine testing on terrestrial solar cell system componentsSamples of FEP-encapsulated silicon solar cells and various potential encapsulation or cover materials were subjected to both accelerated and real-time testing. The durability of the samples was determined by measuring changes in solar cell output or optical transmission as a function of exposure. The tests revealed some problem areas in the structural integrity of the materials, e.g., delamination and cracking in FEP. These problems were probably related to defects in fabrication. FEP and Aclar had the least transmission loss after accelerated exposure equivalents of 5 and 3 years, respectively.
Document ID
19750053324
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Forestieri, A. F.
Anagnostou, E. (NASA Lewis Research Center Cleveland, Ohio, United States)
Date Acquired
August 8, 2013
Publication Date
May 1, 1975
Subject Category
Energy Production And Conversion
Meeting Information
Meeting: Institute of Electrical and Electronics Engineers, Photovoltaic Specialists Conference
Location: Phoenix, AZ
Start Date: May 6, 1975
End Date: May 8, 1975
Sponsors: Institute of Electrical and Electronics Engineers
Accession Number
75A37396
Distribution Limits
Public
Copyright
Other

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