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Auger electron spectroscopy at high spatial resolution and nA primary beam currentsAn experimental Auger microprobe system is described which incorporates a field-emission electron gun and total beam currents in the nanoampere range. The distinguishing characteristics of this system include a large multistation UHV specimen chamber, pulse counting and fully digital Auger signal-processing techniques, and digital referencing methods to eliminate the effects of beam instabilities. Some preliminary results obtained with this system are described, and it is concluded that field-emission electron sources can be used for high-resolution Auger electron spectroscopy with primary-beam spots of less than 100 nm and beam currents of the order of 1 nA.
Document ID
19750054888
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Todd, G.
Poppa, H.
Moorhead, D.
(NASA Ames Research Center Moffett Field, Calif., United States)
Bales, M.
(NASA Ames Research Center Moffett Field; California, University, Berkeley, Calif., United States)
Date Acquired
August 8, 2013
Publication Date
August 1, 1975
Publication Information
Publication: Journal of Vacuum Science and Technology
Volume: 12
Subject Category
Instrumentation And Photography
Accession Number
75A38960
Funding Number(s)
CONTRACT_GRANT: NAS2-8381
CONTRACT_GRANT: NCA2-OR-050-510
Distribution Limits
Public
Copyright
Other

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