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Elastrostatic-discharge damage to semiconductorsFailure mechanisms, test techniques, and quality control procedures for difficult-to-detect class of failures have been devised. Test circuit provides electrostatic discharge similar to those encountered in production situation and assists in evaluation of susceptibility of specific circuits and devices
Document ID
19760000586
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Freeman, E. R., Jr. (Martin Marietta Corp.)
Beall, J. R. (Martin Marietta Corp.)
Date Acquired
August 8, 2013
Publication Date
March 1, 1977
Publication Information
Publication: NASA Tech Briefs
Volume: 1
Issue: 4
ISSN: 0145-319X
Subject Category
Fabrication Technology
Report/Patent Number
LAR-11739
Report Number: LAR-11739
ISSN: 0145-319X
Accession Number
76B10586
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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