NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Technological development of high energy density capacitorsA study was conducted to develop cylindrical wound metallized film capacitors rated 2 micron F 500 VDC that had energy densities greater than 0.1J/g. Polysulfone (PS) and polyvinylidene (PVF2) were selected as dielectrics. Single film PS capacitors of 0.2J/g (uncased) were made of 3.75 micron material. Single film PVF2 capacitors of 0.19J/g (uncased) were made of 6.0 micron material. Corona measurements were made at room temperature, and capacitance and dissipation factor measurements were made over the ranges 25 C to 125 C and 120 Hz to 100 kHz. Nineteen of twenty PVF2 components survived a 2500 hour dc plus ac life test. Failure analyses revealed most failures occurred at wrinkles, but some edge failures were also seen. A 0.989g case was designed. When the case was combined with the PVF2 component, a finished energy density of 0.11J/g was achieved.
Document ID
19760011263
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Parker, R. D.
(Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 3, 2013
Publication Date
February 1, 1976
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-124926
P75-477
Report Number: NASA-CR-124926
Report Number: P75-477
Accession Number
76N18351
Funding Number(s)
CONTRACT_GRANT: NAS3-18925
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available