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Implementation of an experimental fault-tolerant memory systemThe experimental fault-tolerant memory system described in this paper has been designed to enable the modular addition of spares, to validate the theoretical fault-secure and self-testing properties of the translator/corrector, to provide a basis for experiments using the new testing and correction processes for recovery, and to determine the practicality of such systems. The hardware design and implementation are described, together with methods of fault insertion. The hardware/software interface, including a restricted single error correction/double error detection (SEC/DED) code, is specified. Procedures are carefully described which, (1) test for specified physical faults, (2) ensure that single error corrections are not miscorrections due to triple faults, and (3) enable recovery from double errors.
Document ID
19760052254
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Carter, W. C.
(IBM Thomas J. Watson Research Center Yorktown Heights, N.Y., United States)
Mccarthy, C. E.
(IBM Corp. Huntsville, Ala., United States)
Date Acquired
August 8, 2013
Publication Date
June 1, 1976
Publication Information
Publication: IEEE Transactions on Computers
Volume: C-25
Subject Category
Computer Operations And Hardware
Accession Number
76A35220
Funding Number(s)
CONTRACT_GRANT: NAS8-20899
CONTRACT_GRANT: NAS8-30749
Distribution Limits
Public
Copyright
Other

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