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Gain and Phase-margin measurementsSimple battery-powered test circuit will contribute negligible error when taking open-loop measurements of gain and phase parameters. This is especially helpful when measuring high-grain circuits containing integrators.
Document ID
19770000025
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Pierce, B. D. (Ball Bros. Res. Corp.)
Date Acquired
August 8, 2013
Publication Date
June 1, 1977
Publication Information
Publication: NASA Tech Briefs
Volume: 2
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-13296
Report Number: NPO-13296
ISSN: 0145-319X
Accession Number
77B10025
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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