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Optical integrated-circuit testerComputer controlled device can check typical medium scale unit in less than one minute. System scans integrated circuit chip with narrow beam of light while simultaneously scanning reference chip.
Document ID
19770000098
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Micka, E. A.
Reynolds, R. K.
Date Acquired
August 8, 2013
Publication Date
June 1, 1977
Publication Information
Publication: NASA Tech Briefs
Volume: 2
Issue: 1
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
NPO-13282
Report Number: NPO-13282
ISSN: 0145-319X
Accession Number
77B10098
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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