NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Window defect planar mapping techniqueA method of planar mapping defects in a window having an edge surface and a planar surface. The method is comprised of steps for mounting the window on a support surface. Then a light sensitive paper is placed adjacent to the window surface. A light source is positioned adjacent to the window edge. The window is then illuminated with the source of light for a predetermined interval of time. Defects on the surface of the glass, as well as in the interior of the glass are detected by analyzing the developed light sensitive paper. The light source must be in the form of optical fibers or a light tube whose light transmitting ends are placed near the edge surface of the window.
Document ID
19770003956
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Minton, F. R.
(Rockwell Intern. Corp. Downey, Calif., United States)
Minton, U. O.
(Rockwell Intern. Corp. Downey, Calif., United States)
Date Acquired
August 8, 2013
Publication Date
October 12, 1976
Subject Category
Optics
Report/Patent Number
Patent Number: NASA-CASE-MSC-19442-1
Patent Number: US-PATENT-3,985,454
Patent Application Number: US-PATENT-APPL-SN-558600
Accession Number
77N10899
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-MSC-19442-1|US-PATENT-3,985,454
Patent Application
US-PATENT-APPL-SN-558600
No Preview Available