NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Due to the lapse in federal government funding, NASA is not updating this website. We sincerely regret this inconvenience.

Back to Results
SputteringThe potential of using the sputtering process as a deposition technique is reviewed; however, the manufacturing and sputter etching aspects are also discussed. The basic mechanism for dc and rf sputtering is described. Sputter deposition is presented in terms of the unique advantageous features it offers such as versatility, momentum transfer, stoichiometry, sputter etching, target geometry (coating and complex surfaces), precise controls, flexibility, ecology, and sputtering rates. Sputtered film characteristics, such as strong adherence and coherence and film morphology, are briefly evaluated in terms of varying the sputtering parameters. Also discussed are some of the specific industrial areas which are turning to sputter deposition techniques.
Document ID
19770005293
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Spalvins, T.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1976
Subject Category
Engineering (General)
Report/Patent Number
E-8944
NASA-TM-X-73527
Report Number: E-8944
Report Number: NASA-TM-X-73527
Meeting Information
Meeting: Symp. of the Mech. Failures Prevent. Group
Location: Gaithersburg, MD
Country: United States
Start Date: November 3, 1976
End Date: November 5, 1976
Sponsors: NBS
Accession Number
77N12236
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available