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Industrial ion source technologyA 30 cm electron bombardment ion source was designed and fabricated for micromachining and sputtering applications. This source has a multipole magnetic field that employs permanent magnets between permeable pole pieces. An average ion current density of 1 ma/sq cm with 500 eV argon ions was selected as a design operating condition. The ion beam at this operating condition was uniform and well collimated, with an average variation of plus or minus 5 percent over the center 20 cm of the beam at distances up to 30 cm from the ion source. A variety of sputtering applications were undertaken with a small 10 cm ion source to better understand the ion source requirements in these applications. The results of these experimental studies are also included.
Document ID
19770009305
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kaufman, H. R.
(Colorado State Univ. Fort Collins, CO, United States)
Date Acquired
September 3, 2013
Publication Date
November 1, 1976
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-135149
Report Number: NASA-CR-135149
Accession Number
77N16248
Funding Number(s)
CONTRACT_GRANT: NSG-3086
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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