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Analytical procedure for evaluating speckle-effect instrumentationA general analysis suitable for developing speckle effect instruments and a simplified analysis suitable for evaluating laser speckle instrumentation are presented. The simplified analysis is summarized as a list of equations. Several sample applications are discussed.
Document ID
19770011475
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Decker, A. J. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 3, 2013
Publication Date
February 1, 1977
Subject Category
Instrumentation And Photography
Report/Patent Number
E-8924
NASA-TM-X-3478
Report Number: E-8924
Report Number: NASA-TM-X-3478
Accession Number
77N18419
Funding Number(s)
PROJECT: RTOP 505-04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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