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Crop status evaluations and yield predictionsOne phase of the large area crop inventory project is presented. Wheat yield models based on the input of environmental variables potentially obtainable through the use of space remote sensing were developed and demonstrated. By the use of a unique method for visually qualifying daily plant development and subsequent multifactor computer analyses, it was possible to develop practical models for predicting crop development and yield. Development of wheat yield prediction models was based on the discovery that morphological changes in plants are detected and quantified on a daily basis, and that this change during a portion of the season was proportional to yield.
Document ID
19770011591
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Haun, J. R.
(Clemson Univ. SC, United States)
Date Acquired
September 3, 2013
Publication Date
September 27, 1976
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NASA-CR-151180
Report Number: NASA-CR-151180
Accession Number
77N18535
Funding Number(s)
CONTRACT_GRANT: NAS9-14006
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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