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The use of analytical surface tools in the fundamental study of wearVarious techniques and surface tools available for the study of the atomic nature of the wear of materials are reviewed These include chemical etching, x-ray diffraction, electron diffraction, scanning electron microscopy, low-energy electron diffraction, Auger emission spectroscopy analysis, electron spectroscopy for chemical analysis, field ion microscopy, and the atom probe. Properties of the surface and wear surface regions which affect wear, such as surface energy, crystal structure, crystallographic orientation, mode of dislocation behavior, and cohesive binding, are discussed. A number of mechanisms involved in the generation of wear particles are identified with the aid of the aforementioned tools.
Document ID
19770012957
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Buckley, D. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1977
Subject Category
Solid-State Physics
Report/Patent Number
NASA-TM-X-73437
E-8792
Meeting Information
Meeting: Intern. Conf. on Wear of Mater.
Location: St. Louis
Start Date: April 25, 1977
End Date: April 27, 1977
Sponsors: ASME
Accession Number
77N19901
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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