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Method for measuring biaxial stress in a body subjected to stress inducing loadsA method is described for measuring stress in test articles including the steps of obtaining for a calibrating specimen a series of transit time differentials between the second wave echo for a longitudinal wave and the first wave echo for each of a pair of shear waves propagated through the specimen as it is subjected to known stress load of a series of stress loads for thus establishing a series of indications of the magnitudes for stress loads induced in the specimen, and thereafter obtaining a transit time differential between the second wave echo for a longitudinal wave and the first wave echo for each of a pair of shear waves propagated in the planes of the stress axes of a test article and comparing the transit time differential thus obtained to the series of transit time differentials obtained for the specimen to determine the magnitude of biaxial stress in the test article.
Document ID
19770021567
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Clotfelter, W. N.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
December 5, 1977
Subject Category
Structural Mechanics
Report/Patent Number
Patent Number: US-PATENT-4,033,182
Patent Number: NASA-CASE-MFS-23299-1
Patent Application Number: US-PATENT-APPL-SN-700673
Accession Number
77N28511
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,033,182|NASA-CASE-MFS-23299-1
Patent Application
US-PATENT-APPL-SN-700673
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