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A laser based characterization facility for silicon photocell studiesA computer controlled laser based characterization facility used for detailed studies of silicon photodetectors and spectral response measurement on silicon solar cell is described. The power in the laser beam is measured with respect to electrical standards using an electrically calibrated pyroelectric radiometer.
Document ID
19770023588
Document Type
Conference Paper
Authors
Geist, J. (National Bureau of Standards Washington, DC, United States)
Lind, M. A. (National Bureau of Standards Washington, DC, United States)
Schaefer, A. R. (National Bureau of Standards Washington, DC, United States)
Zalewski, E. F. (National Bureau of Standards Washington, DC, United States)
Date Acquired
August 8, 2013
Publication Date
January 1, 1976
Publication Information
Publication: NASA. Lewis Res. Center Terrest. Photovoltaic Meas., 2
Subject Category
RESEARCH AND SUPPORT FACILITIES (AIR)
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19770023577Analytic PrimaryTerrestrial photovoltaic measurements, 2
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