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Problems in photoresponse distribution measurementPhotoresponse distribution measurement by scanning a light spot across the surface of a semiconductor device is examined. The technqiue is used for solar cell characterization because the measured quantity is the direct expression of the distribution of the desired performance of the device. An apparatus for measuring the photoresponse distribution was set and used in the development of polysilicon thin film solar cells. A schmeatic diagram of the apparatus and an example of measurement are shown.
Document ID
19770023598
Document Type
Conference Paper
Authors
Minagawa, S. (Hitachi Ltd. Tokyo, Japan)
Warabisako, T. (Hitachi Ltd. Tokyo, Japan)
Date Acquired
August 8, 2013
Publication Date
January 1, 1976
Publication Information
Publication: NASA. Lewis Res. Center Terrest. Photovoltaic Meas., 2
Subject Category
ENERGY PRODUCTION AND CONVERSION
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19770023577Analytic PrimaryTerrestrial photovoltaic measurements, 2
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