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Real time reflectometerA real time reflectometer with the particular utility of measuring fairly rapid (transient) changes in the specular reflectance of a sample which is continuously exposed to a perturbing environment is described. A fixed radiation source, a fixed detector, a uniformly rotating sample wheel, and a uniformly rotating optical wheel protect against misalignment problems. The reflectometer operates by comparing the measurings of a reflected signal with that of a reference signal made within fractions of a second of one another. Reflectance is measured in the infrared, visible, and vacuum ultraviolet regions.
Document ID
19770024521
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Zwiener, J. M.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
August 9, 1977
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,040,750
Patent Application Number: US-PATENT-APPL-SN-691256
Patent Number: NASA-CASE-MFS-23118-1
Accession Number
77N31465
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,040,750|NASA-CASE-MFS-23118-1
Patent Application
US-PATENT-APPL-SN-691256
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