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The charge-flow transistor - A new MOS deviceA new device, the charge-flow transistor (CFT), has been developed to achieve integrated MOS compatibility in sensor applications, such as gas, humidity, and fire detection, where one is interested in monitoring the transverse resistance of a thin film. The resistive material is incorporated into the gate structure of the CFT in such a way that there is a time delay between the application of the gate-to-source voltage and the appearance of a complete channel. This time delay depends on the resistivity of the thin film. A theory of device operation is presented, together with experimental results on the first CFT's. These results confirm the principles of operation, and demonstrate the utility of the CFT for making fully integrated sensing devices.
Document ID
19770035664
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Senturia, S. D.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Sechen, C. M.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Wishneusky, J. A.
(MIT Cambridge, Mass., United States)
Date Acquired
August 9, 2013
Publication Date
January 15, 1977
Publication Information
Publication: Applied Physics Letters
Volume: 30
Subject Category
Electronics And Electrical Engineering
Accession Number
77A18516
Distribution Limits
Public
Copyright
Other

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