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Variable temperature pressure cell for polycrystalline X-ray studies down to 2 K - Application to BiA variable pressure diamond anvil cell is described for operation at temperatures continuously variable from 300 down to 2 K and controllable within 10 mK. Polycrystalline X-ray data are collected from the pressure cavity by means of either (1) standard photographic techniques, (2) diffractometer measurements, or (3) energy dispersive diffractometry. The facility has been used to examine parts of the phase diagram of Bi. Results from this study indicate that the Bi-I and Bi-III structures are retained to low temperatures; however, there is no evidence to support a structural transition from Bi-V to Bi-VIII.
Document ID
19770067315
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Skelton, E. F.
(Naval Research Lab. Washington, DC, United States)
Carpenter, E. R., Jr.
(U.S. Navy, Naval Research Laboratory, Washington D.C., United States)
Spain, I. L.
(Naval Research Lab. Washington, DC, United States)
Yu, S. C.
(Naval Research Lab. Washington, DC, United States)
Liu, C. Y.
(Maryland, University College Park, Md., United States)
Date Acquired
August 9, 2013
Publication Date
July 1, 1977
Publication Information
Publication: Review of Scientific Instruments
Volume: 48
Subject Category
Instrumentation And Photography
Accession Number
77A50167
Distribution Limits
Public
Copyright
Other

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