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Automated tester for MOS devicesAutomated system rapidly diagnoses MOS integrated circuits. Its programed electronics investigate transistor and cell characteristics to compile data needed for screening. Program can be changed rapidly to alter test procedures, test duration, and precision.
Document ID
19780000001
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Cockrum, R. H.
Date Acquired
August 9, 2013
Publication Date
June 1, 1978
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
ISSN: 0145-319X
Report Number: NPO-14088
NPO-14088
Accession Number
78B10001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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