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Surface examination of small particlesElectron-microscopy specimen-preparation technique is used to study micron size particles. Process involves coating particles with vacuum-evaporated carbon, dissolving particles in solvent, then examining residue. Process is applicable to study of catalysts, nucleation and growth of metal oxides, and to determine chemical nature of lubricated surfaces after wear has occurred.
Document ID
19780000075
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buzek, B. C.
Glasgow, T. K.
Date Acquired
August 9, 2013
Publication Date
June 1, 1978
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 1
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
LEW-12842
ISSN: 0145-319X
Report Number: LEW-12842
Accession Number
78B10075
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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