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Calibration standards for PIND testsCalibrated set of microcircuit packages containing tiny particles with known masses can be used as reference standards for Particle-Impact Noise-Detection (PIND) tests.
Document ID
19780000388
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Gaudiano, S.
Date Acquired
August 9, 2013
Publication Date
January 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MSC-18169
Report Number: MSC-18169
ISSN: 0145-319X
Accession Number
78B10388
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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