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Testing integrated circuits by photoexcitationSystem for testing integrated circuits uses photoexcitation to determine quality of internal elements inaccessible to electrical tests. Approach prevents direct monitoring of internal operation of circuit by measurements at external terminals and is superior to electron beam scanning due to nondestructiveness.
Document ID
19780000451
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Erickson, J. J. (Hughes Aircraft Co.)
Levy, M. E. (Hughes Aircraft Co.)
Date Acquired
August 9, 2013
Publication Date
March 1, 1979
Publication Information
Publication: NASA Tech Briefs
Volume: 3
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-23943
ISSN: 0145-319X
Report Number: MFS-23943
Accession Number
78B10451
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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