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Charge distributions near metal-dielectric interfaces before and after dielectric surface flashoverA technique was developed for measuring surface charge distribution near interfaces without placing any measuring apparatus near the face of the samples. The results of measurements which were made on FEP Teflon and Kapton dielectrics, before and after are given flashover, with various types of interfaces. Also given are data showing mean time between flashovers for various configurations exposed to a variety of environmental conditions. Several charge transfer mechanisms are considered as a means by which stable charge distributions may be maintained near interfaces.
Document ID
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Robinson, J. W.
(Pennsylvania State Univ. University Park, PA, United States)
Date Acquired
August 9, 2013
Publication Date
February 24, 1977
Publication Information
Publication: NASA. Lewis Res. Center Proc. of the Spacecraft Charging-Technol. Conf.
Subject Category
Electronics And Electrical Engineering
Accession Number
Distribution Limits
Work of the US Gov. Public Use Permitted.
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