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Photoelectron spectrometer with means for stabilizing sample surface potentialAn improved X-ray photoelectron spectrometer is disclosed, which includes circuit means to determine the surface potential of a sample, e.g., an insulator. The circuit means comprise an electron gun, whose potential is modulated at a preselected frequency above and below a selected potential with respect to the spectrometer common potential, e.g., ground. The beam of electrons is directed to the sample surface. The sample's surface potential is offset by an offset power supply with respect to the spectrometer common potential until the ac current which flows through the sample reaches a peak amplitude. A lock-in amplifier is included to measure the ac current in phase with the modulating frequency.
Document ID
19780002486
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Grunthaner, F. J.
(JPL)
Lewis, B. F.
(JPL)
Date Acquired
September 3, 2013
Publication Date
October 4, 1977
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,052,614
Patent Number: NASA-CASE-NPO-13772-1
Patent Application Number: US-PATENT-APPL-SN-675351
Accession Number
78N10429
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,052,614|NASA-CASE-NPO-13772-1
Patent Application
US-PATENT-APPL-SN-675351
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