NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
JAN transistor and diode characterization test programA statistical summary of electrical characterization was performed on JAN diodes and transistors. Parameters are presented with test conditions, mean, standard deviation, lowest reading, 10% point, 90% point and highest reading.
Document ID
19780003354
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Takeda, H. (DCA Reliability Lab. Sunnyvale, CA, United States)
Date Acquired
September 3, 2013
Publication Date
March 1, 1977
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-150463
Report Number: NASA-CR-150463
Accession Number
78N11297
Funding Number(s)
CONTRACT_GRANT: NAS8-31944
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available