NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Laser extensometerA drift compensated and intensity averaged extensometer for measuring the diameter or other properties of a substantially cylindrical sample based upon the shadow of the sample is described. A beam of laser light is shaped to provide a beam with a uniform intensity along an axis normal to the sample. After passing the sample, the portion of the beam not striking said sample is divided by a beam splitter into a reference signal and a measurement signal. Both of these beams are then chopped by a light chopper to fall upon two photodiode detectors. The resulting ac currents are rectified and then divided into one another, with the final output being proportional to the size of the sample shadow.
Document ID
19780006437
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Stocker, P. J.
(Rockwell International Corp. Canoga Park, Calif., United States)
Marcus, H. L.
(Rockwell International Corp. Canoga Park, Calif., United States)
Date Acquired
September 3, 2013
Publication Date
December 6, 1977
Subject Category
Lasers And Masers
Report/Patent Number
Patent Number: US-PATENT-4,061,427
Patent Number: NASA-CASE-MFS-19259-1
Patent Application Number: US-PATENT-APPL-SN-732630
Accession Number
78N14380
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,061,427|NASA-CASE-MFS-19259-1
Patent Application
US-PATENT-APPL-SN-732630
No Preview Available