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Semiconductor projectile impact detectorA semiconductor projectile impact detector is described for use in determining micrometeorite presence, as well as its flux and energy comprising a photovoltaic cell which generates a voltage according to the light and heat emitted by the micrometeorites upon impact. A counter and peak amplitude measuring device were used to indicate the number of particules which strike the surface of the cell as well as the kinetic energy of each of the particles.
Document ID
19780010447
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Shriver, E. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
October 25, 1977
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,055,089
Patent Number: NASA-CASE-MFS-23008-1
Patent Application Number: US-PATENT-APPL-SN-665734
Accession Number
78N18390
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,055,089|NASA-CASE-MFS-23008-1
Patent Application
US-PATENT-APPL-SN-665734

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