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Use of a laser for the spectral analysis of semiconductor materialsConventional applications of lasers for emission spectroscopy involving direct recording of light pulses of an evaporated substance emitted from the sample under the action of the laser light (direct method) were examined. Use of the laser light for conversion of the substance to a vapor and feeding the vapors into the conventional source of emission such as arc, sparks, etc. (the so called 2 stage excitation) were studied for use in the spectral analysis, of semiconductors. The direct method has a high reproducibility (5-7%); the 2 stage excitation method, characterized by the same intensity as obtained with the conventional constant, current arc, has better reproducibility than the direct method (15-20%). Both methods can be used for the analysis of samples without prior preparation. Advantages of these methods are the elimination of impurities picked up during trituration of the samples into powders and shortening of the analytical procedures.
Document ID
19780011286
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Karyakin, A. V.
(NASA Headquarters Washington, DC United States)
Akhmanova, M. V.
(NASA Headquarters Washington, DC United States)
Kaygorodov, V. A.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 3, 2013
Publication Date
March 1, 1978
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NASA-TM-75257
Report Number: NASA-TM-75257
Accession Number
78N19229
Funding Number(s)
CONTRACT_GRANT: NASW-2790
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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